Panalytical Scanning Diffractometer X’Pert Pro MPD Alpha1

Panalytical Scanning Diffractometer X’Pert Pro MPD Alpha1

Panalytical Scanning Diffractometer X’Pert Pro MPD Alpha1

  • Primary monochromator and para-focussing optics for high resolution measurements – Co or Cu radiation
  • Reflection and transmission geometry
  • Used for structural characterisation of powdered samples (Rietveld analysis): lattice parameters, crystallite size, microstrain analysis

Museum lead

Dr Jens Najorka

Key facts

Technique: X-ray diffraction