The Museum's analysis centre offers 5 instruments with micro-analysis capabilities. Follow the links below to discover key features and technical details, see examples and find out which would be most suitable for your applications.

  • True-colour cathodoluminescence image taken with the Cameca SX100
    Electron probe micro-analysis (EPMA)

    The Cameca SX100 is a dedicated wavelength dispersive X-ray electron microprobe that can perform quantitative elemental analysis of samples while left unattended overnight. Get technical information and discover how it works.

  • Scanning electron microscopy image of a laser ablation crater formed in glass
    Laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS)

    The (ESI) New Wave UP193FX laser ablation system and Agilent 7500cs ICP-MS are coupled together to provide a dedicated LA-ICP-MS system that can perform quantitative trace element analysis of solid materials and U-Pb age determinations in accessory mineral phases. Find out more.

  • Elemental map of a polished section through a meteorite produced using the Zeiss EVO 15LS
    Scanning electron microscopy with X-ray analysis

    The LEO 1455 VP, Zeiss EVO 15LS and Carl Zeiss Ultra Plus Field Emission SEMs are all capable of X-ray analysis. Find out more.