Scanning electron microscopy with X-ray analysis

Three of the scanning electron microscopes in the Museum's imaging facility are capable of X-ray analysis. Follow the links below to discover key features and technical details, see examples and find out which would be most suitable for your applications.

  • Energy dispersive X-ray (EDX) phase map of a section of the Vigarano meteorite
    LEO 1455 VP SEM

    The LEO 1455VP scanning electron microscope is highly versatile, suitable for use with uncoated and delicate material such as type specimens. It can work in variable pressure and high vacuum modes and can be used for both imaging and qualitative X-ray analysis.

  • X-ray map showing the unusual preservation of an ancient fish called Palaeospondylus
    Zeiss EVO 15LS SEM

    The Zeiss EVO 15 LS is a very versatile, user-friendly analytical scanning electron microscope fitted with diverse detectors. Among its many applications are the imaging of rock and mineral surfaces, sample composition analysis and the creation of cathodoluminescence images.

  • Secondary electron image of butterfly scales from Vanessa atalanta
    Carl Zeiss Ultra Plus Field Emission SEM

    The Carl Zeiss Ultra Plus scanning electron microscope offers ultra high resolution imaging. The instrument's revolutionary charge compensation system allows non-conducting specimens to be imaged without the need for coating.

  • Elemental map of a polished meteorite section produced using the Zeiss EVO 15LS
    Energy dispersive X-ray (EDX) analysis

    Find out the key features of EDX analysis.