Three of the scanning electron microscopes in the Museum's imaging facility are capable of X-ray analysis. Follow the links below to discover key features and technical details, see examples and find out which would be most suitable for your applications.
The LEO 1455VP scanning electron microscope is highly versatile, suitable for use with uncoated and delicate material such as type specimens. It can work in variable pressure and high vacuum modes and can be used for both imaging and qualitative X-ray analysis.
The Zeiss EVO 15 LS is a very versatile, user-friendly analytical scanning electron microscope fitted with diverse detectors. Among its many applications are the imaging of rock and mineral surfaces, sample composition analysis and the creation of cathodoluminescence images.
The Carl Zeiss Ultra Plus scanning electron microscope offers ultra high resolution imaging. The instrument's revolutionary charge compensation system allows non-conducting specimens to be imaged without the need for coating.
Find out the key features of EDX analysis.