The Zeiss EVO 15LS analytical scanning electron microscope can be used for a very wide range of applications. Follow the links below to see some examples.
The microscope can be used to obtain detailed surface images of biological specimens that have been coated with a thin layer of metal.
The Zeiss EVO 15LS SEM can be used to look at the complex surface of samples without damaging them, making it ideal for examining valuable specimens.
Three-dimensional models can be created using stereo-pair images. These can be used to determine the width, depth and volume of structures such as impact craters.
The Zeiss EVO 15LS is commonly used to examine polished and carbon-coated rock and mineral surfaces before they are analysed further.
The instrument's energy dispersive X-ray detector is often used to quantitatively analyse the composition of minerals of interest.
Created using the microscope's X-ray detectors, these can identify interesting and unusual materials, illustrate textures and measure area abundances.
Mineral identification using the microscope's X-ray detectors at low vacuum or variable pressure can reveal, for example, how animals are preserved as fossils.
Backscattered electron images or X-ray maps can be used to produce a quantitative measurement of mineral abundance by 'point counting' minerals within an area of a polished rock sample.
The Zeiss EVO 15LS can be used to locate specific small grains of interest in large sample areas, measure their size and identify their composition.
WDX scans can be useful for recognising the presence of small quantities of elements which could be missed by other methods such as energy dispersive X-ray scans.
Images created from light emitted by a sample can provide information about the internal structure of crystals. They can be used to construct histories of mineral deposition and crystal growth for a variety of purposes.