Variable pressure scanning electron microscopy
Close up of a section of butterfly wing, imaged using the LEO 1455VP scanning electron microscope and artificially coloured.
The Museum's imaging facility has three scanning electron microscopes that can work at variable pressure. Follow the links below to discover key features and technical details, see examples and find out which would be most suitable for your applications.
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LEO 1455 VP SEM
The LEO 1455VP scanning electron microscope is highly versatile, suitable for use with uncoated and delicate material such as type specimens. It can work in variable pressure and high vacuum modes and can be used for both imaging and qualitative X-ray analysis.
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Zeiss EVO 15LS SEM
The Zeiss EVO 15LS is a very versatile, user-friendly analytical scanning electron microscope fitted with diverse detectors. Among its many applications are the imaging of rock and mineral surfaces, sample composition analysis and the creation of cathodoluminescence images.
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Carl Zeiss Ultra Plus Field Emission SEM
The Carl Zeiss Ultra Plus scanning electron microscope offers ultra high resolution imaging. The instrument's revolutionary charge compensation system allows non-conducting specimens to be imaged without the need for coating.