- Secondary electron detector
- 4-quadrant solid-state backscattered detector
- Variable pressure secondary electron detector
- Energy dispersive X-ray (EDX) detector (Oxford Instruments X-Max detector)
Magnifications: 20x - 60,000x
Image Output: 8-bit TIFF, up to 3072 x 2304 pixels
Key instrument features
- Highly versatile analytical scanning electron microscope
- Can operate in both variable pressure and high vacuum modes
Low vacuum mode
- For imaging and qualitative X-ray analysis of uncoated and delicate material - including type specimens.
- Pressure may be increased to as much as 200Pa, although best image resolution will be obtained at approximately 10-60Pa.
- At short working distances images may be obtained at magnifications in excess of 10,000x, giving sub-micron resolution.
High vacuum mode
- For imaging and quantitative analysis.
- Large chamber capable of accommodating samples up to approximately 15x15x15cm.
- Can accommodate long working distances for imaging at low magnifications (x20).
- Peltier cooling stage can be attached for freezing samples down to -30ºC, useful for imaging specimens which may otherwise dehydrate with the SEM.
- The instrument can also operate in scanning transmission electron microscope (STEM) mode using a dedicated detector.
- EDX analysis
Find out about EDX analysis