LEO 1455 VP SEM

Instrument specifications

Detectors:

  • Secondary electron detector
  • 4-quadrant solid-state backscattered detector
  • Variable pressure secondary electron detector
  • Energy dispersive X-ray (EDX) detector (Oxford Instruments X-Max detector)

Magnifications: 20x - 60,000x

Image Output: 8-bit TIFF, up to 3072 x 2304 pixels

Key instrument features

  • Highly versatile analytical scanning electron microscope
  • Can operate in both variable pressure and high vacuum modes
          Low vacuum mode
    • For imaging and qualitative X-ray analysis of uncoated and delicate material - including type specimens.
    • Pressure may be increased to as much as 200Pa, although best image resolution will be obtained at approximately 10-60Pa.
    • At short working distances images may be obtained at magnifications in excess of 10,000x, giving sub-micron resolution.
          High vacuum mode
    • For imaging and quantitative analysis.
  • Large chamber capable of accommodating samples up to approximately 15x15x15cm.
  • Can accommodate long working distances for imaging at low magnifications (x20).
  • Peltier cooling stage can be attached for freezing samples down to -30ºC, useful for imaging specimens which may otherwise dehydrate with the SEM.
  • The instrument can also operate in scanning transmission electron microscope (STEM) mode using a dedicated detector.
  • EDX analysis

Find out about EDX analysis

  • Laboratory-grown galena crystals imaged with the LEO 1455VP scanning electron microscope
    Examples of LEO 1455 VP SEM applications

    View some examples of images obtained using the LEO 1455 VP scanning electron microscope. See how the instrument can be used to analyse the element content of rock samples.

Contact details

For further information or to arrange to use the microscopes contact:

Dr Alex Ball
Tel: +44 (0)20 7942 5263
Fax: +44 (0)20 7942 5811

Email Alex Ball

Laboratory-grown galena crystals imaged with the LEO 1455VP scanning electron microscope
Examples of LEO 1455 VP SEM applications

View some examples of images obtained using the LEO 1455 VP scanning electron microscope. See how the instrument can be used to analyse the element content of rock samples.

Our scanning electron microscopes