Philips XL30 Field Emission SEM
Scanning electron microscope image of the common wasp Vespula vulgaris, taken with the XL30 and then artificially coloured by computer.
Instrument specifications
Detectors:
- Secondary electron detector
- Solid state backscatter detector (2 segment)
- Gatan X-ray Ultra Microscope (XuM) nano-CT system
Magnifications: 20x - 200,000x
Resolution: 2nm
Image Output: 8-bit TIFF, up to 3872 x 3082 pixels
Key instrument features
- Computer controlled
- Fully motorised stage (except tilt) allowing systematic searching of stubs, with the ability to record and return to features of interest
- Can rapidly produce stereo pairs and perform on-screen measurements
- Gatan XuM nano-CT system allows the 2D and 3D-visualisation of the internal structure of specimens in the SEM at submicron resolution
Get information on the Museum's Gatan XuM nano-CT system
Sample preparation
Strict control is maintained over specimen preparation and handling methods since 'dirty' specimens will contaminate the column and degrade the performance of the microscope.
- Specimens and stubs should only be handled with forceps.
- Only coated specimens which have been permanently mounted onto stubs or pins using slow-drying araldite or silver dag can be examined.
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Examples of Philips XL30 Field Emission SEM applications
View some examples of images obtained using the XL30 scanning electron microscope. The instrument's high resolution makes it exceptionally suitable for imaging minute organisms.
Contact details
For further information or to arrange to use the microscopes contact:
Dr Alex Ball
Tel: +44 (0)20 7942 5263
Fax: +44 (0)20 7942 5811
Examples of Philips XL30 Field Emission SEM applications
View some examples of images obtained using the XL30 scanning electron microscope. The instrument's high resolution makes it exceptionally suitable for imaging minute organisms.