The Ultra Plus scanning electron microscope is suitable for high resolution imaging of both biological and non-biological specimens.
The microscope's charge compensation system allows non-conducting samples to be imaged without the need for coating.
Secondary electron images of volcanic ash from a volcanic plume in the crater rim of Villarrica volcano, Chile, collected using an air filter. Scalebars = 1μm.
This material was collected and imaged to help scientists understand the processes of ash emission within the volcanic plumes of constantly active volcanoes.
Secondary electron images of butterfly scales from Artogeia napi. Acquired using the Ultra Plus charge compensation system and low kV.
Secondary electron images of butterfly scales from Vanessa atalanta. Acquired using the Ultra Plus charge compensation system and low kV.
Silver oxide nanoparticles imaged using the in-lens secondary detector at low kV. Scalebar = 100nm
Carbon nanotubes imaged using the in-lens secondary detector at low kV. Top scalebar = 200nm, bottom scalebar = 1μm
Copper oxide nanoparticles imaged using the scanning transmission electron microscope detector in dark field mode. Scalebar = 200nm
High resolution energy dispersive X-ray phase map of the Murchison meteorite prepared using the Oxford Instruments X-Max silicon drift detector and INCA automated montaging software. Red = magnesium, blue = aluminium, green = calcium.
This map was acquired using 10kV acceleration voltage, allowing high spatial resolution element mapping.