Reflection nano-CT
3D volume of a bryozoan prepared using reflection nano-CT
Instrument: Gatan X-ray Ultra Microscope (XuM)
The XuM is an accessory to a scanning electron microscope (SEM), developed by Gatan Inc. It uses X-rays to visualise the internal structure of specimens in the SEM in 2D and 3D. It is capable of producing sub-micron 3D computed tomography (CT) of specimens.
Technical details
Resolution: Approximately 200nm, although dependent on sample size and working conditions
Maximum sample size: Approximately 1mm, although dependent on density of sample
Sample Preparation
Because the samples are placed into a high vacuum SEM the samples must be dry and mounted onto a pin head using a non volatile medium (PVA, silver dag or slow-drying araldite).
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How the Gatan X-ray Ultra Microscope (XuM) works
Find out more about how a CT data set is created using the XuM and see a schematic of the microscope.
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Examples of reflection nano-CT applications
View a selection of nano-CT data sets that highlight the applications for this technique.
Examples of reflection nano-CT applications
View a selection of nano-CT data sets that highlight the applications for this technique.