Instrument: Gatan X-ray Ultra Microscope (XuM)
The XuM is an accessory to a scanning electron microscope (SEM), developed by Gatan Inc. It uses X-rays to visualise the internal structure of specimens in the SEM in 2D and 3D. It is capable of producing sub-micron 3D computed tomography (CT) of specimens.
Resolution: Approximately 200nm, although dependent on sample size and working conditions
Maximum sample size: Approximately 1mm, although dependent on density of sample
Because the samples are placed into a high vacuum SEM the samples must be dry and mounted onto a pin head using a non volatile medium (PVA, silver dag or slow-drying araldite).