Reflection nano-CT

Instrument: Gatan X-ray Ultra Microscope (XuM)

The XuM is an accessory to a scanning electron microscope (SEM), developed by Gatan Inc. It uses X-rays to visualise the internal structure of specimens in the SEM in 2D and 3D. It is capable of producing sub-micron 3D computed tomography (CT) of specimens.

Technical details

Resolution: Approximately 200nm, although dependent on sample size and working conditions

Maximum sample size: Approximately 1mm, although dependent on density of sample

Sample Preparation

Because the samples are placed into a high vacuum SEM the samples must be dry and mounted onto a pin head using a non volatile medium (PVA, silver dag or slow-drying araldite).

CT contact details

Dr Farah Ahmed

Tel: +44 (0)20 7942 5157

Email

2D virtual slide through a foram
Examples of reflection nano-CT applications

View a selection of nano-CT data sets that highlight the applications for this technique.