Agilent 7700x ICP-MS
Instrument: Agilent 7700x ICP-MS
The detector can achieve linear performance from parts per trillion or lower, up to hundreds of parts per million in solution. The excellent sensitivity of the instrument and the very efficient collision / reaction cell interface means that analysis of 'difficult' elements such as V, Cr, As can be particularly good.
This technique is routinely used to analyse trace and ultra-trace levels of most metals and some non-metals in:
Li, Be, Al, Sc, Ti, V, Cr, Co, Ni, Cu, Zn, Ga, As, Rb, Y, Zr, Nb, Mo, platinum group elements, Cd, Sn, Sb, Cs, Ba, rare earth elements, Hf, Ta, W, Re, Tl, Pb, Th, U
For further information or to discuss your analytical requirements contact:
Dr Stanislav Strekopytov
Tel: +44 (0)20 7942 5498
Fax: +44 (0)20 7942 5811
Email